Wafer Sort Probe Applications

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Probe Needles for
Wafer Sort and Test Applications

APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.

Because the requirements and tolerances of probe needle card manufacturers differ, all APS probe needles are made to individual customer specifications.  APS’s quality will produce higher yields in your bend and production processes.  These higher yields will ultimately reduce the overall cost of manufacture.  

For more information on probe needle materials please click on the appropriate link:

Wafer Test
Palladium Alloy &
Beryllium-Copper
Palladium Allo & Berillium-Copper Pins
Pins in these materials are provided in diameters from .003"-.020” and are suitable for a variety of test and industrial applications.
Wafer Sort
and Testing
Wafer Sort and Wafer Test
Advanced Probing Systems manufactures probes suitable for cantilever wafer test.
Solid Pins in .020"
Diameters or Larger
Large Diameter Pins
APS’s capabilities to produce pins in diameters of .020” or larger for a variety of test and industrial applications.
Click Here to
Request a Quote
Request for Pin Quote
Request a quote directly from APS. For additional information see the ordering information link.

 

Advanced Probing Systems, Inc.

2300 Central Avenue, Suite F
Boulder, CO 80301
Toll Free: 800-631-0005 • Phone: 303-939-9384 • Fax: 303-939-9032
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