Probes for LED and LCD Subsequent Test
Subsequent testing in LED and LCD situations requires probes that are very different than those used in wafer test. The requirement for low contact resistance and the requirement to avoid damage to the surface being tested require a careful selection of material. Another difference is the larger diameters and rounded tips of these pins. APS pins in various materials have set the standard for LED and LCD testing post wafer. The quality and integrity of the material as well as APS’s quality production methods can guarantee your success in this test arena.
Tungsten, Rungsten-rhenium and Beryllium-copper Material Properties